| Date | Announcement |
| 2025/12/10 | Website up! |
The IEEE 35th Asian Test Symposium (ATS 2026), a premier international forum in the field of electronics testing, will be held at the Hotel Nikko Kaohsiung in Taiwan from November 18 to 20, 2026. This conference serves as a pivotal platform for academic researchers and industry professionals from around the globe. Its primary objective is to facilitate the exchange of groundbreaking ideas and the presentation of the latest research findings. We cordially invite the submission of original papers covering all aspects of system, module, and device testing, as well as broader test technologies.
Connect with researchers and professionals worldwide
Share groundbreaking ideas and latest research
Submit original papers on testing technologies
The ATS 2026 Organizing Committee invites original, unpublished paper submissions on the topics listed below. Regular paper submissions should be made electronically by PDF manuscripts only, not exceeding 6 pages in IEEE 2-column format (including abstract, figures, tables, and bibliography). A submission will be considered evidence that upon acceptance, at least one author will attend the conference to make the presentation. Authors of accepted papers are also responsible for preparing the final manuscripts in time to be included in the electronic proceedings, which will eventually be published in IEEE Xplore Digital Library. At least one full registration to the conference is required for each accepted paper. More information is available from the following link: Submission Guidelines.
Topics — Original papers on, but not limited to, the following areas are invited:
