Agenda

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ATS 2026 — Day 1 agenda
Day 1 December 1, 2026 (Tuesday)
12:00–17:30 Registration (Foyer, 3F)
13:30–15:00 Tutorial 1 (Banquet Ballroom A+B) Tutorial 2 (Banquet Ballroom C+D)
15:00–15:30 Coffee Break
15:30–16:30 Keynote 1 (Banquet Ballroom A+B)
17:30–19:00 Welcome Reception
ATS 2026 — Day 2 agenda
Day 2 December 2, 2026 (Wednesday)
08:00–17:00 Registration (Foyer, 3F)
08:30–09:00 Opening Session (Banquet Ballroom A+B)
09:00–10:00 Keynote 2 (Banquet Ballroom A+B)
10:00–10:20 Coffee Break
10:20–11:20 Keynote 3 (Banquet Ballroom A+B)
11:20–12:20 Panel (Banquet Ballroom A+B)
12:20–13:40 Lunch
13:40–14:40 Special Session 1 AI-era Semiconductor Test (Banquet Ballroom A+B) RS2 Multi-Die Security (Banquet Ballroom C+D) RS6 Timing-Aware Test (Meeting Room III+IV)
14:40–15:40 LBR Short Presentation (Banquet Ballroom A+B) Ph.D. Contest (Banquet Ballroom C+D)
15:40–16:00 Coffee Break
16:00–17:00 Special Session 2 Cross-Layer AI Reliability (Banquet Ballroom A+B) RS5 Test Generation & Diagnosis (Banquet Ballroom C+D) RS9 Emerging & Approximate Circuits (Meeting Room III+IV)
17:00–18:20
18:30–20:30 Banquet
ATS 2026 — Day 3 agenda
Day 3 December 3, 2026 (Thursday)
08:00–15:40 Registration (Foyer, 3F)
08:30–09:30 Keynote 4 (Banquet Ballroom A+B)
09:30–10:30 Keynote 5 (Banquet Ballroom A+B)
10:30–10:50 Coffee Break
10:50–11:50 Keynote 6 (Banquet Ballroom A+B)
11:50–13:00 Lunch
13:00–14:00 RS1 Chiplet and 3D IC Testing (Banquet Ballroom A+B) RS4 ML for Test (Banquet Ballroom C+D) RS8 AI Fault Tolerance (Meeting Room III+IV)
14:00–14:20 Coffee Break
14:20–15:20 Embedded Tutorial 1 (Banquet Ballroom A+B) RS3 Hardware Security (Banquet Ballroom C+D) RS7 Functional Safety (Meeting Room III+IV)
15:20–15:40 Closing Session (Banquet Ballroom A+B)