Technical Program Committee | IEEE 35th Asian Test Symposium (ATS 2026)

Members:
Satyadev Ahlawat (Indian Institute of Technology Jammu)

Mangesh Amdekar (NVIDIA)

Masayuki Arai (Nihon University)

Xiaole Cui (Peking University)

Patrick Girard (LIRMM, CNRS/University of Montpellier)

Dimitris Gizopoulos (National and Kapodistrian University of Athens)

Sybille Hellebrand (Paderborn University)

Yoshinobu Higami (Ehime University)

Michael Hsiao (Virginia Tech)

Chun-Lung Hsu (National Central University)

Chih-Tsun Huang (National Tsing Hua University)

Shi-Yu Huang (National Tsing Hua University)

Zhengfeng Huang (Hefei University of Technology)

Hideyuki Ichihara (Hiroshima City University)

Tomoo Inoue (Hiroshima City University)

Noor-Ain Kamsani (Universiti Putra Malaysia)

Haruhiko Kaneko (Institute of Science Tokyo)

Saqib Khursheed (University of Liverpool)

Haruo Kobayashi (Gunma University)

Erik Larsson (Lund University)

Chien-Mo Li (National Taiwan University)

Huawei Li (Institute of Computing Technology, Chinese Academy of Sciences)

Shu-Min Li (National Sun Yat-sen University)

Xiaowei Li (Institute of Computing Technology, Chinese Academy of Sciences)

Shyue-Kung Lu (National Taiwan University of Science and Technology)

Baolei Mao (Zhengzhou University)

Soumya Mittal (Qualcomm Technologies Inc.)

Thulasiraman Nandhakumar (University of Nottingham Malaysia)

Satoshi Ohtake (Oita University)

Chia-Yee Ooi (Universiti Teknologi Malaysia)

Alex Orailoglu (University of California, San Diego)

Matteo-Sonza Reorda (Politecnico di Torino)

Kewal Saluja (University of Wisconsin-Madison)

Hiroshi Takahashi (Ehime University)

Jaynarayan-T Tudu (Indian Institute of Technology Tirupati)

Jerzy Tyszer (Poznan University of Technology)

Senling Wang (Ehime University)

Xiaoqing Wen (Kyushu Institute of Technology)

Dong Xiang (Tsinghua University)

Mingfu Xue (East China Normal University)

Aibin Yan (Hefei University of Technology)